■Describe that there are various methods for measuring the film thickness of substances, and ultraviolet and visible spectrophotometers can be used for simple non-destructive measurement. This article discusses how much film thickness can be measured with ultraviolet and visible spectrophotometers. Measured with a spectrophotometer, the reflected light on the surface and inside of the film interfered with each other to obtain a fluctuating interference spectrum. The thickness can be calculated by calculating the wave number in the spectrum within a certain wavelength range (but the refractive index of the film substance is required). The thinner the film, the lower the wavenumber in the spectrum, and the thicker the increase. This time the limits of thin and thick films were measured. …… As an authorized agent of Shimadzu Corporation in Shanghai, Nayong Instrument provides you with a full range of services. For more information about this product, please call 021-61610135
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